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GE's phoenix nanome|x: Ultra high-resolution nanofocus X-ray inspection system Featured

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The phoenix nanome|x is an ultra high-resolution nanofocus X-ray inspection system designed for inspecting high-quality assemblies and interconnections in the semiconductor and SMT industries.

The system offers excellent performance and versatility and can be used for 2D X-ray inspection as well as for full 3D computed tomography (nano ct). With the new x|act software package the phoenix nanome|x is the system of choice to ensure meeting actual and future zero defect requirements.

 

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Last modified on Thursday, 29 December 2011 16:17

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